The Core Facility for Microscopy and Materials Analysis (CMMA) combines the essential infrastructure for characterising materials using electron and ion microscopy and the associated spectroscopic methods and in-situ testing technology. Two scanning electron microscopes (SEM), a focused ion beam system (FIB) and a dual-beam system (SEM-FIB combination) are available for this purpose. All scanning electron microscopes have the capability of elemental analysis using energy-dispersive X-ray spectroscopy (EDS). It is also possible to perform elemental analyses using wavelength-dispersive X-ray spectroscopy (WDS). EBSD measurements (backscattered electron diffraction) can also be performed to determine orientation relationships, phase analyses and quantitative microstructure assessments. To determine mechanical characteristics, the CMMA has an in-situ tensile-compression module with a load capacity of up to 5 kN. In-situ experiments can also be performed using a heating stage. Each of the available devices is located in its own laboratory with corresponding operator and preparation workstations for sample preparation. In a separate preparation laboratory, it is possible to carry out more extensive preparations (rough and fine cutting, metallographic preparation), the production of sample holders or surface modifications by sputtering and vapour deposition with various metals.