MAPEX Core Facility for Materials Analytics (MAPEX-CF) Save as PDFShow print view

The MAPEX-CF is a shared materials analysis and characterization facility that offers research services and the use of equipment for both university-internal and external users. It comprises five investigation areas: 3D Materials Analytics, Electron Microscopy, Surface Analytics, Spectroscopy, and X-ray Diffraction. The scientific focus of the MAPEX-CF is the investigation of structures, topographical features and, physical, and chemical properties of the surface and the bulk of materials during their synthesis, manufacturing, and use. The MAPEX-CF is embedded institutionally within the MAPEX Center for Materials and Processes and was established by the University of Bremen under the DFG project number 434618658.
Address: Bibliothekstraße 1
28359   Bremen
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  • Host Institution

Universität Bremen
Bibliothekstraße 1
28359   Bremen

  • Scientific Domain

Primary Subjects:
  • Physics
  • Materials Science and Engineering
Secondary Subjects:
  • Biology
  • Chemistry
  • Geosciences (including Geography)
  • Category

Materials Synthesis and Testing Facilities
  • Scientific Services

The MAPEX-CF offers services within its five investigation areas (1) 3D Materials Analytics, (2) Electron Microscopy, (3) Surface Analytics, (4) Spectroscopy, and (5) X-ray Diffraction. Internal and external researchers can request access to a variety of material's characterization techniques ranging from imaging (XRM, micro-CT, SEM, TEM, AFM, interferometry), diffraction (powder and single-crystal XRD), and spectroscopy (XPS, Raman, FT-IR). Its equipment is used according to two operation modes: Service Operation, where all experiments are performed by the MAPEX-CF Application Scientists or their teams; and Application Operation, where users perform the experiments themselves with minor support from the MAPEX-CF.
  • Scientific Equipment

  • X-ray Computed Microtomography ProCon CT-ALPHA
  • X-ray microscope Zeiss Xradia 520 Versa
  • Powder diffractometer Bruker D8 Advance und Discover
  • Powder diffractometer Stoe Stadi MP
  • Powder diffractometer Panalytical X’Pert Pro
  • Single-crystal diffractometer Bruker D8 Venture
  • Probe corrected (S)TEM Thermo-Fisher SPECTRA 300
  • (S)TEM FEI Titan 80-300
  • FIB/SEM Zeiss Auriga 40
  • Vertical Scanning Interferometer with Raman spectroscope
  • Fast scanning AFM; JPK Nanowizard III AFM
  • Low-Energy Electron Microscope Elmitec
  • Raman Aramis Spectroscope
  • XPS and LEED Omicron VT
  • Chirascan Plus Circular Dichroism spectroscope Applied Photophysics
  • Keywords

  • Electron microscopy
  • X-ray microscopy
  • X-ray diffraction
  • Spectroscopy
  • Surface analytics
  • Interferometry
  • Microscopy
  • Computed tomography
  • In-situ analyses
  • High-throughput screening
  • Correlated workflows
  • Real-time analysis
  • Materials processing
  • Networks

MAPEX Center for Materials and Processes
  • Users per annum

Internal Users:
External Users in total:
External Users:
External Users in the EU:
External Users outside of EU:
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